High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data
✍ Scribed by A. Steuwer; J.R. Santisteban; M. Turski; P.J. Withers; T. Buslaps
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 257 KB
- Volume
- 238
- Category
- Article
- ISSN
- 0168-583X
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✦ Synopsis
The feasibility of high-resolution strain mapping in bulk samples with both high-spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beam line ID15A at the ESRF. This was achieved by using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point strain uncertainty of 10 À5 . The presented results have been validated with alternative methods, in this case FE model predictions. This technique promises to be a significant development in the in situ characterisation of strain fields around cracks in bulk engineering samples. The implication of slit size and grain size are discussed. This paper is a concise version of the work published in [A.