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Automatic detection and high resolution fine structure analysis of conic X-ray diffraction lines

✍ Scribed by J. Bauch; F. Henschel; M. Schulze

Publisher: John Wiley and Sons
Year: 2011
Tongue: English
Weight: 241 KB
Volume: 46
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.201000608

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✦ Synopsis

Abstract

The presented method demonstrates a first step in the development of a high resolution “Residual stress microscope” and facilitates through the implementation of largely automated procedures a fast detection of diffraction lines in the form of conic sections. It has been implemented for, but is not exclusively used for the Kossel technique and the “X‐ray Rotation‐Tilt Method” (XRT). The resulting multifaceted evaluable data base of many X‐ray diffraction radiographies can be used not only for the systematic analysis of anomalies in diffraction lines (reflection fine structure), but also for direct calculation and output of precision residual stress tensors. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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