✦ LIBER ✦

Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

✍ Scribed by S Shiraki; H Ishii; M Amano; Y Nihei; M Owari; C Oshima; T Koshikawa; R Shimizu

Book ID: 117215923
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 487 KB
Volume: 493
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(01)01185-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

High-angular resolution x-ray photoelect

High-angular resolution x-ray photoelectron diffraction measurements of Si(111)

✍ C. Pirri; U. Kafader; G. Gewinner; P. Wetzel 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 386 KB

Multiple scattering X-ray photoelectron

Multiple scattering X-ray photoelectron diffraction calculations using reflection high energy electron diffraction theory

✍ J.F. Hart; J.L. Beeby 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 394 KB

Thickness measurement of GaN epilayer us

Thickness measurement of GaN epilayer using high resolution X-ray diffraction technique

✍ Gan Feng; Jianjun Zhu; Xiaoming Shen; Baoshun Zhang; Degang Zhao; Yutian Wang; H 📂 Article 📅 2003 🏛 Science in China Press (SCP) 🌐 English ⚖ 263 KB

High-resolution electron microscopy and

High-resolution electron microscopy and X-ray diffraction studies of MCM-48

✍ Ralf Schmidt; Michael Stöcker; Duncan Akporiaye; Elisabeth Heggelund Tørstad; Ar 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 534 KB

A cubic member of the M41S family with a three-dimensional pore system, denoted as MCM-48, was synthesised. By combining X-ray powder diffraction (XRD) with high-resolution electron microscopy (HREM), a cubic symmetry with an Ia3d space group was determined for the as-synthesised and the calcined MC

Chemical vapor deposition of tungsten ox

Chemical vapor deposition of tungsten oxides: A comparative study by X-ray photoelectron spectroscopy, X-ray diffraction and reflection high energy electron diffraction

✍ B. Yous; S. Robin; A. Donnadieu; G. Dufour; C. Maillot; H. Roulet; C. Senemaud 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 244 KB

Characterization of short-period Sim Gen

Characterization of short-period Sim Gen superlattices by high-resolution transmission electron microscopy and X-ray diffraction

✍ W. Jäger; D. Stenkamp; P. Ehrhart; K. Leifer; W. Sybertz; H. Kibbel; H. Presting 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 992 KB