✦ LIBER ✦

Characterization of short-period Sim Gen superlattices by high-resolution transmission electron microscopy and X-ray diffraction

✍ Scribed by W. Jäger; D. Stenkamp; P. Ehrhart; K. Leifer; W. Sybertz; H. Kibbel; H. Presting; E. Kasper

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Growth and characterization by X-ray dif

✍ A. Mazuelas; A. Ruiz 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 494 KB

Characterization of InGaAs and InAlAs la

✍ R. Houdré; F. Gueissaz; M. Gailhanou; J.-D. Ganiére; A. Rudra; M. Ilegems 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 407 KB

Characterization of polymer-layered sili

✍ Alexander B. Morgan; Jeffrey W. Gilman 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 1001 KB

Structural and electrical properties of

✍ T. Behr; D. Hommel; H. Cerva; J. Nürnberger; V. Beyersdorfer; G. Landwehr 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 596 KB

Structural characterization of highly st

✍ A. Mazuelas; S.I. Molina; G. Aragón; J. Meléndez; M.L. Dotor; P. Huertas; F. Bri 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 499 KB

MOCVD growth and characterization by Ram

✍ R. Azoulay; B. Jusserand; G. Le Roux; P. Ossart; L. Dugrand 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 515 KB