Structural characterization of highly strained InAs N monolayer lasers and quantum well structures by X-ray diffraction and transmission electron microscopy

✍ Scribed by A. Mazuelas; S.I. Molina; G. Aragón; J. Meléndez; M.L. Dotor; P. Huertas; F. Briones

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 499 KB
• Volume: 127
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(93)90691-o