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Observation and analysis of quantum wire structures by high-resolution X-ray diffraction

✍ Scribed by L. Tapfer; G.C. La Rocca; H. Lage; R. Cingolani; P. Grambow; A. Fischer; D. Heitmann; K. Ploog


Book ID
118365504
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
461 KB
Volume
267
Category
Article
ISSN
0039-6028

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## Abstract The presented method demonstrates a first step in the development of a high resolution β€œResidual stress microscope” and facilitates through the implementation of largely automated procedures a fast detection of diffraction lines in the form of conic sections. It has been implemented for