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High-resolution x-ray topography and diffraction study of bulk regular domain structures in LiNbO3 crystals

✍ Scribed by Antipov, V. V.; Blistanov, A. A.; Roshchupkina, E. D.; Tucoulou, R.; Ortega, L.; Roshchupkin, D. V.

Book ID
118182338
Publisher
American Institute of Physics
Year
2004
Tongue
English
Weight
618 KB
Volume
85
Category
Article
ISSN
0003-6951

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## Abstract We report results of X‐ray investigations of tellurium‐doped GaAs~1–__x__~ P~__x__~ (with 0.07 ≀ __x__ ≀ 0.20) single crystals, conducted in order to support finding proper growth parameters which would yield a material of sufficient homogeneity of the lattice parameter for prospective