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Study of the lattice strain relaxation in the Ga1-XAlXSb/GaSb system by x-ray topography and high resolution diffraction

โœ Scribed by C. Bocchi; F. Germini; S. Franchi; A. Baraldi; S. Gennari; R. Magnanini; A. V. Drigo


Book ID
110271758
Publisher
Springer US
Year
1999
Tongue
English
Weight
207 KB
Volume
10
Category
Article
ISSN
0957-4522

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