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Strain and compositional profile determination in ion bombarded heterostructures by the complementary use of RBS/channeling and high resolution X-ray diffraction

✍ Scribed by A. Turos; J. Gaca; M. Wojcik; A. Stonert; R. Groetzschel

Book ID: 114165556
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 135 KB
Volume: 190
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(01)01285-x

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