✦ LIBER ✦

Direct Determination of Strain and Composition Profiles in SiGe Islands by Anomalous X-Ray Diffraction at High Momentum Transfer

✍ Scribed by Schülli, T. U.; Stangl, J.; Zhong, Z.; Lechner, R. T.; Sztucki, M.; Metzger, T. H.; Bauer, G.

Book ID: 124154041
Publisher: The American Physical Society
Year: 2003
Tongue: English
Weight: 289 KB
Volume: 90
Category: Article
ISSN: 0031-9007
DOI: 10.1103/PhysRevLett.90.066105

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Direct evaluation of composition profile

Direct evaluation of composition profile, strain relaxation, and elastic energy of Ge:Si(001) self-assembled islands by anomalous x-ray scattering

✍ Magalhães-Paniago, R.; Medeiros-Ribeiro, G.; Malachias, A.; Kycia, S.; Kamins, T 📂 Article 📅 2002 🏛 The American Physical Society 🌐 English ⚖ 219 KB

Influence of growth temperature on inter

Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mapping

✍ Schülli, T. U.; Stoffel, M.; Hesse, A.; Stangl, J.; Lechner, R. T.; Wintersberge 📂 Article 📅 2005 🏛 The American Physical Society 🌐 English ⚖ 867 KB

Strain and compositional profile determi

Strain and compositional profile determination in ion bombarded heterostructures by the complementary use of RBS/channeling and high resolution X-ray diffraction

✍ A. Turos; J. Gaca; M. Wojcik; A. Stonert; R. Groetzschel 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 135 KB