Comparison of nitrogen compositions in the as-grown GaNxAs1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy

✍ Scribed by Fan, W. J.; Yoon, S. F.; Ng, T. K.; Wang, S. Z.; Loke, W. K.; Liu, R.; Wee, A.

• Book ID: 118187825
• Publisher: American Institute of Physics
• Year: 2002
• Tongue: English
• Weight: 361 KB
• Volume: 80
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1483913