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The influence of in situ photoexcitation on a defect structure generation in Ar implanted GaAs(001) crystals revealed by high-resolution x-ray diffraction and Rutherford backscattering spectroscopy

✍ Scribed by Chtcherbatchev, K D; Bublik, V T; Markevich, A S; Mordkovich, V N; Alves, E; Barradas, N P; Sequeira, A D


Book ID
120568995
Publisher
Institute of Physics
Year
2003
Tongue
English
Weight
142 KB
Volume
36
Category
Article
ISSN
0022-3727

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