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Comparison and improvement of two core compact models for double-gate MOSFETs

✍ Scribed by Xingye Zhou; Zhize Zhou; Jian Zhang; Lining Zhang; Chenyue Ma; Jin He; Xing Zhang


Book ID
108271815
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
339 KB
Volume
54
Category
Article
ISSN
0038-1101

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The drain currents of nanometer double-gate MOSFETs with gate lengths in the range from 100 to 5 nm are calculated using a hierarchy of simulation approaches. By comparing Monte Carlo (MC), drift-di usion (DD), and hydrodynamic (HD) simulation results the suitability of the DD and HD models for the