Comparative analysis of temperature thermally induced instability between Si–In–Zn–O and Ga–In–Zn–O thin film transistors

✍ Scribed by Sang Yeol Lee; Do Hyung Kim; Bosul Kim; Hyun Kwang Jung; Dae Hwan Kim

• Book ID: 113937345
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 590 KB
• Volume: 520
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2011.10.058