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Comparative analysis of oxide phase formation and its effects on electrical properties of SiO2/InSb metal-oxide-semiconductor structures

✍ Scribed by Jaeyel Lee; Sehun Park; Jungsub Kim; Changjae Yang; Sujin Kim; Chulkyun Seok; Jinsub Park; Euijoon Yoon


Book ID
113937665
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
695 KB
Volume
520
Category
Article
ISSN
0040-6090

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