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Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology

✍ Scribed by Wenping Wang, ; Reddy, V.; Krishnan, A.T.; Vattikonda, R.; Krishnan, S.; Yu Cao,

Book ID: 120043103
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 370 KB
Volume: 7
Category: Article
ISSN: 1530-4388
DOI: 10.1109/TDMR.2007.910130

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