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Analysis and Modeling of Threshold Voltage Mismatch for CMOS at 65 nm and Beyond

✍ Scribed by Johnson, J.B.; Hook, T.B.; Yoo-Mi Lee

Book ID: 115543244
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 365 KB
Volume: 29
Category: Article
ISSN: 0741-3106
DOI: 10.1109/led.2008.2000649

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