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[IEEE 2012 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Montreal, QC, Canada (2012.06.17-2012.06.19)] 2012 IEEE Radio Frequency Integrated Circuits Symposium - Characterization and modeling of enhanced voltage RF MESFETs on 45nm CMOS for RF applications

✍ Scribed by Wilk, Seth J.; Ghajar, M. Reza; Lepkowski, William; Bakkaloglu, Bertan; Thornton, Trevor J.

No coin nor oath required. For personal study only.

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