𝔖 Bobbio Scriptorium
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Statistical model of NBTI and reliability simulation for analogue circuits

✍ Scribed by Z. LV; L. Milor; S. Yang


Book ID
118165887
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
784 KB
Volume
52
Category
Article
ISSN
0026-2714

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