## Abstract Large‐scale RCL circuits with a large number of ports have been widely employed to model interconnect circuits, such as the power/ground networks, clock distribution networks and large data buses in VLSI. The input‐dependent moment‐matching technique, which takes the input excitations i
A method for fast simulation of multiple catastrophic faults in analogue circuits
✍ Scribed by Michał Tadeusiewicz; Stanisław Hałgas
- Publisher
- John Wiley and Sons
- Year
- 2008
- Tongue
- English
- Weight
- 227 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0098-9886
- DOI
- 10.1002/cta.570
No coin nor oath required. For personal study only.
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