✦ LIBER ✦
Failure pattern determination for integrated circuit devices using wet-chemical decapsulation and statistical reliability modelling
✍ Scribed by D.M. Barry; C. Chrysanthou; N.A. Weir
- Book ID
- 103551014
- Publisher
- Elsevier Science
- Year
- 1986
- Weight
- 984 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0143-8174
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