Combinational circuits in a one-element basis
β Scribed by E. L. Stolov
- Publisher
- Springer US
- Year
- 1989
- Tongue
- English
- Weight
- 264 KB
- Volume
- 45
- Category
- Article
- ISSN
- 1573-8795
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
## Abstract A new method is proposed to diagnose single stuckβat faults in combinational circuits. In this method, based on the operations of the nonfaulty circuit, first the possible faulty paths are examined from the primary outputs, at which errors have been observed, toward the primary inputs t
A transistor level model and a testing methodology are presented for BiCMOS circuits. The model fully describes the functional (logical) grad parametric behavior of the 13iCMOS circuits in the presence of transistor stuck faults. Tile model employs the logic transistor function (LTF). The LTF descri