๐”– Bobbio Scriptorium
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Chemical Etching Studies and Transmission Electron Microscopy of Silicon Carbide

โœ Scribed by GABOR, T.; STICKLER, R.


Book ID
109628580
Publisher
Nature Publishing Group
Year
1963
Tongue
English
Weight
617 KB
Volume
199
Category
Article
ISSN
0028-0836

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Transmission electron microscopy studies
โœ Pink, Francis X. ;Ostreicher, Kim J. ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 713 KB

Transmission electron microscopy has been used to isolate and examine the intergranular glass phase in hot-pressed silicon nitride/silicon carbide composites. Previously there have been difficulties in locating a suitable region for studies of this nature because the interfering nitride and carbide