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Defect studies in ZnSSe and ZnMgSSe by chemical etching and transmission electron microscopy

✍ Scribed by Shiraishi, M. ;Tomiya, S. ;Taniguchi, S. ;Nakano, K. ;Ishibashi, A. ;Ikeda, M.

Book ID: 105384857
Publisher: John Wiley and Sons
Year: 1995
Tongue: English
Weight: 456 KB
Volume: 152
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211520206

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