Transmission electron microscopy has been used to isolate and examine the intergranular glass phase in hot-pressed silicon nitride/silicon carbide composites. Previously there have been difficulties in locating a suitable region for studies of this nature because the interfering nitride and carbide
In-situ transmission electron microscopy of the oxidation and etching of silicon
β Scribed by J.M. Gibson; F.M. Ross
- Publisher
- Elsevier Science
- Year
- 1992
- Weight
- 129 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0261-3069
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## Abstract The intermediate voltage electron microscopeβtandem user facility in the Electron Microscopy Center at Argonne National Laboratory is described. The primary purpose of this facility is electron microscopy with in situ ion irradiation at controlled sample temperatures. To illustrate its