Transmission electron microscopy studies
Transmission electron microscopy studies of plasma-etched silicon nitride/silicon carbide composites
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Pink, Francis X. ;Ostreicher, Kim J.
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Article
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1987
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Wiley (John Wiley & Sons)
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English
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Transmission electron microscopy has been used to isolate and examine the intergranular glass phase in hot-pressed silicon nitride/silicon carbide composites. Previously there have been difficulties in locating a suitable region for studies of this nature because the interfering nitride and carbide