𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Investigation of polycrystalline silicon layers by electron microscopy and x-ray diffraction

✍ Scribed by S. Horiuchi

Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
491 KB
Volume
18
Category
Article
ISSN
0038-1101

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Microstructure investigation of equal ch
Microstructure investigation of equal channel angular pressed aluminium by X-ray diffraction and scanning electron microscopy
✍ A. Korchef; N. Njah; A. W. Kolsi πŸ“‚ Article πŸ“… 2009 πŸ› John Wiley and Sons 🌐 English βš– 196 KB

## Abstract In the present work, investigations on the microstructure of a commercial purity 1100 aluminum that had been subjected to moderate to strong deformation (strains of 1 to 4) by equal channel angular pressing (ECAP) were carried out using X‐ray diffraction (XRD) and scanning electron micr