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Charge trapping and annealing in high-/spl kappa/ gate dielectrics

✍ Scribed by Felix, J.A.; Shaneyfelt, M.R.; Fleetwood, D.M.; Schwank, J.R.; Dodd, P.E.; Gusev, E.P.; Fleming, R.M.; D'Emic, C.

No coin nor oath required. For personal study only.

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