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Charge trap generation in LPCVD oxides under high field stressing

✍ Scribed by Bhat, N.; Apte, P.P.; Saraswat, K.C.

Book ID: 114536424
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 712 KB
Volume: 43
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.485537

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