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Charge loss in metal-nitride-oxide-semiconductor (MNOS) devices at high temperatures

✍ Scribed by C.S. Dobbs; W.D. Brown; J.R. Yeargan

Book ID: 107856650
Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 378 KB
Volume: 26
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(83)90098-9

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