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Electrical and chemical analysis of zinc oxide interfaces with high dielectric constant barium tantalate and aluminum oxide in metal-insulator-semiconductor structures fabricated at Low temperatures

✍ Scribed by Fang-Ling Kuo; Mohammad H. Maneshian; Nigel D. Shepherd


Book ID
113937123
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
961 KB
Volume
520
Category
Article
ISSN
0040-6090

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