Charge loss in metal-nitride-oxide-semiconductor (MNOS) devices at high temperatures : C. S. Dobbs, W. D. Brown and J. R. Yeargan. Solid-St. Electron.26 (5), 427 (1983)

• Book ID: 103279722
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 123 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90786-8