Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

✍ Scribed by Black, J. D.; Ball II, D. R.; Robinson, W. H.; Fleetwood, D. M.; Schrimpf, R. D.; Reed, R. A.; Black, D. A.; Warren, K. M.; Tipton, A. D.; Dodd, P. E.; Haddad, N. F.; Xapsos, M. A.; Kim, H. S.; Friendlich, M.

• Book ID: 121232903
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 572 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2008.2007231