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Analysis and Design of Nanoscale CMOS Storage Elements for Single-Event Hardening With Multiple-Node Upset

✍ Scribed by Sheng Lin; Yong-Bin Kim; Lombardi, F.

Book ID: 111867385
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 584 KB
Volume: 12
Category: Article
ISSN: 1530-4388
DOI: 10.1109/tdmr.2011.2167233

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