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Design of a Nanometric CMOS Memory Cell for Hardening to a Single Event With a Multiple-Node Upset

✍ Scribed by D'Alessio, Marco; Ottavi, Marco; Lombardi, Fabrizio

Book ID: 121232898
Publisher: IEEE
Year: 2014
Tongue: English
Weight: 730 KB
Volume: 14
Category: Article
ISSN: 1530-4388
DOI: 10.1109/TDMR.2012.2206814

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