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Characterization of the polysilicon thin film transistors elaborated in high and low temperature processes. Study of the density of traps

✍ Scribed by H. Sehil; N.M. Rahmani; L. Pichon; R. Menezla; F. Raoult; Z. Benamara


Book ID
117543267
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
408 KB
Volume
90
Category
Article
ISSN
0379-6779

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