Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements

✍ Scribed by Hatzopoulos, A.T.; Arpatzanis, N.; Tassis, D.H.; Dimitriadis, C.A.; Oudwan, M.; Templier, F.; Kamarinos, G.

• Book ID: 114618674
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 286 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2007.893607