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Measurement and modeling of the low-temperature penetration-depth anomaly in high-quality MgB2 thin films

✍ Scribed by Agassi, Y.D.; Oates, D.E.; Moeckly, B.H.

Book ID: 119347670
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 951 KB
Volume: 480
Category: Article
ISSN: 0921-4534
DOI: 10.1016/j.physc.2012.04.034

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