Influence of structural disorder on low-temperature behavior of penetration depth in electron-doped high-TC thin films

✍ Scribed by A.J.C. Lanfredi; S. Sergeenkov; F.M. Araujo-Moreira

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 422 KB
• Volume: 450
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/j.physc.2006.08.008