✦ LIBER ✦

Characterization of purified biomarker compounds using time of flight-secondary ion mass spectrometry (ToF-SIMS)

✍ Scribed by Jan Toporski; Andrew Steele

Book ID: 116807553
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 521 KB
Volume: 35
Category: Article
ISSN: 0146-6380
DOI: 10.1016/j.orggeochem.2004.03.006

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of gunpowder samples us

Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS)

✍ Christine M. Mahoney; Greg Gillen; Albert J. Fahey 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 531 KB

Time-of-flight secondary ion mass spectr

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) of polyisoprenes

✍ Xu, Keyang ;Proctor, Andrew ;Hercules, David M. 📂 Article 📅 1996 🏛 Springer-Verlag ⚖ 817 KB

Investigation into the nature of histori

Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)

✍ J. Batcheller; A.M. Hacke; R. Mitchell; C.M. Carr 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 117 KB

Charakterisierung von Plasma- Polymerfil

Charakterisierung von Plasma- Polymerfilmen mittels Flugzeit- Sekundärionen-Massenspektrometrie (ToF-SIMS). Characterisation Plasma-Polymerfilms by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

✍ M. von Gradowski; M. Wahl; B. Jacoby; H. Hilgers; M. Kopnarski 📂 Article 📅 2005 🏛 John Wiley and Sons 🌐 English ⚖ 481 KB

Stereoregular polypropylenes studied by

Stereoregular polypropylenes studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM)

✍ Xu, Keyang; Gusev, Arkady I.; Hercules, David M. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 424 KB 👁 2 views

Time-of-Ñight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM) were utilized to characterize polypropylenes of di †erent stereoregularity (atactic, syndiotactic and isotactic) deposited on gold-or silver-coated mica surfaces. The AFM images clearly revealed distinctive su

Analysis of hopanes and steranes in sing

Analysis of hopanes and steranes in single oil-bearing fluid inclusions using time-of-flight secondary ion mass spectrometry (ToF-SIMS)

✍ S. SILJESTRÖM; J. LAUSMAA; P. SJÖVALL; C. BROMAN; V. THIEL; T. HODE 📂 Article 📅 2010 🏛 John Wiley and Sons 🌐 English ⚖ 784 KB