Charakterisierung von Plasma- Polymerfilmen mittels Flugzeit- Sekundärionen-Massenspektrometrie (ToF-SIMS). Characterisation Plasma-Polymerfilms by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

✍ Scribed by M. von Gradowski; M. Wahl; B. Jacoby; H. Hilgers; M. Kopnarski

• Book ID: 111702055
• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 481 KB
• Volume: 17
• Category: Article
• ISSN: 0947-076X
• DOI: 10.1002/vipr.200500248