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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) of polyisoprenes

✍ Scribed by Xu, Keyang ;Proctor, Andrew ;Hercules, David M.

Publisher: Springer-Verlag
Year: 1996
Weight: 817 KB
Volume: 122
Category: Article
ISSN: 0344-838X
DOI: 10.1007/bf01252400

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