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Characterization of porous silicon by NRA, RBS and channeling

✍ Scribed by C. Ortega; J. Siejka; G. Vizkelethy

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterisation of thin sputtered silic

✍ A. Markwitz; H. Baumann; E. F. Krimmel; K. Bethge; P. Misaelides 📂 Article 📅 1993 🏛 Springer 🌐 English ⚖ 462 KB

Characterization of metal-doped TiO2 fil

✍ S. Yamamoto; T. Yamaki; H. Naramoto; S. Tanaka 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 127 KB

Optical and In-Depth RBS Characterizatio

✍ Torres-Costa, V.; Pászti, F.; Climent-Font, A.; Martín-Palma, R. J.; Martínez 📂 Article 📅 2005 🏛 The Electrochemical Society 🌐 English ⚖ 185 KB

Investigation of ultra thin SiNxOy layer

✍ R.W. Michelmann; H. Baumann; A. Markwitz; J.D. Meyer; K. Bethge 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 209 KB

NRA and RBS analyses of silicon, alumini

✍ F.C. Stedile; R. Hübler; I.J.R. Baumvol; W.H. Schreiner; F.L. Freire Jr. 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 347 KB

Characterization of InGaN/GaN heterostru

✍ L. Nowicki; R. Ratajczak; A. Stonert; A. Turos; J.M. Baranowski; R. Banasik; K. 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 147 KB