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Characterization of polymer thin films by phase-sensitive acoustic microscopy and atomic force microscopy: a comparative review

✍ Scribed by W. NGWA; W. LUO; A. KAMANYI; K. W. FOMBA; W. GRILL

Book ID: 108864083
Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 246 KB
Volume: 218
Category: Article
ISSN: 0022-2720
DOI: 10.1111/j.1365-2818.2005.01484.x

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