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Acoustics and atomic force microscopy for the mechanical characterization of thin films

✍ Scribed by Daniele Passeri; Andrea Bettucci; Marco Rossi

Publisher: Springer
Year: 2010
Tongue: English
Weight: 487 KB
Volume: 396
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s00216-009-3402-8

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