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Atomic force microscopy modified for studying electric properties of thin films and crystals. Review

✍ Scribed by K. L. Sorokina; A. L. Tolstikhina

Book ID: 110138923
Publisher: SP MAIK Nauka/Interperiodica
Year: 2004
Tongue: English
Weight: 504 KB
Volume: 49
Category: Article
ISSN: 1063-7745
DOI: 10.1134/1.1756648

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