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A thin subsurface layer of a polymer film studied by atomic force microscopy

✍ Scribed by V. I. Trigub; A. V. Plotnov; A. N. Kiselev


Book ID
110128943
Publisher
SP MAIK Nauka/Interperiodica
Year
2001
Tongue
English
Weight
91 KB
Volume
27
Category
Article
ISSN
1063-7850

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Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investig