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Thin liquid films studied by atomic force microscopy

✍ Scribed by Elmar Bonaccurso; Michael Kappl; Hans-Jürgen Butt

Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
727 KB
Volume
13
Category
Article
ISSN
1359-0294

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✦ Synopsis

Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investigating thin liquid films. In this paper we review experimental work on confined Newtonian and non-Newtonian liquids using the AFM.

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## Abstract The atomic force acoustic microscopy (AFAM) technique has been used to determine elastic properties of films with thicknesses decreasing from several hundreds of nanometers to several nanometers. It has been shown that metal films as thin as 50 nm can be characterized directly without t