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Characterization of polymer solar cells by TOF-SIMS depth profiling

โœ Scribed by C.W.T. Bulle-Lieuwma; W.J.H. van Gennip; J.K.J. van Duren; P. Jonkheijm; R.A.J. Janssen; J.W. Niemantsverdriet

Book ID
108417859
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
103 KB
Volume
203-204
Category
Article
ISSN
0169-4332

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Characterization of titanium hydride films covered by nanoscale evaporated Au layers: ToF-SIMS, XPS and AES depth profile analysis
โœ Lisowski, W.; van den Berg, A. H. J.; Leonard, D.; Mathieu, H. J. ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 98 KB ๐Ÿ‘ 2 views

Thin titanium hydride (TiH y ) films, covered by ultrathin gold layers, have been compared with the corresponding titanium films after analysis using a combination of time-of-flight SIMS (ToF-SIMS), XPS and AES. The TiH y layers were prepared under UHV conditions by precisely controlled hydrogen sor