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Characterization of microstructures in nickel alumina catalysts by analytical electron microscopy

✍ Scribed by Ryszard Lamber; Günter Schulz-Ekloff


Publisher
Elsevier Science
Year
1991
Weight
75 KB
Volume
258
Category
Article
ISSN
0167-2584

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Aluminium nitride samples sintered with various Y20: concentrations are characterized by transmission electron microscopy. Topology and second phase characteristics at grain boundaries are investigated by X-ray and diffraction experiments. At low Y:O~ concentrations (up to 10%) second phases (mainly